Design and implementation of a system for rapid inspection of critical dimensions in high volume production

Mechatronics

Volumn 8, Issue 4, 1998, Pages 413-425

  Gallagher, Christopher T ^a   Kurfess, Thomas R ^b  

^a NOKIA RESEARCH CENTER   (United States)

^b GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FITS AND TOLERANCES; INSPECTION; KEYS (FOR LOCKS); MEASUREMENT ERRORS; THICKNESS MEASUREMENT;

HIGH VOLUME PRODUCTION;

PRODUCTION ENGINEERING;

EID: 0032091555     PISSN: 09574158     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0957-4158(97)00056-1     Document Type: Article

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4. Franco, Design with Operational Amplifiers and Analog Integrated Circuits. McGraw-Hill, Inc., NY, 1986. p. 122-3, 153-7.
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8. Dufour I, Busawon M, Premel D, Placko D, General analysis of inductive sensor based systems for non-destructive testing. Journal De Physique, III, 1994;4(8):1481-93.