Uncertainty of extreme fit evaluation for three-dimensional measurement data analysis

CAD Computer Aided Design

Volumn 30, Issue 7, 1998, Pages 549-557

  Choi, Woncheol ^a,c,d,e,f   Kurfess, Thomas R ^a,b,c  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

^b MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^c CARNEGIE MELLON UNIVERSITY   (United States)

^d Seoul National University   (South Korea)

^e University of Seoul   (South Korea)

^f Dongguk University   (South Korea)

Author keywords

Manufacturing; Metrology; Precision; Quality; Sampling; Tolerance

Indexed keywords

COMPUTATIONAL GEOMETRY; COMPUTER AIDED DESIGN; STATISTICAL METHODS;

COORDINATE MEASURING MACHINES (CMM); THREE DIMENSIONAL MEASUREMENT DATA ANALYSIS;

DATA REDUCTION;

EID: 0032097431     PISSN: 00104485     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0010-4485(98)00012-8     Document Type: Article

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