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Volumn 376, Issue 1-2, 2000, Pages 241-248

Microcrystalline silicon phase in silicon oxide thin films developed by photo-CVD technique

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; CRYSTALLINE MATERIALS; CRYSTALLIZATION; DOPING (ADDITIVES); RAMAN SPECTROSCOPY; SILICA; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

EID: 0034318297     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(00)01211-6     Document Type: Article
Times cited : (12)

References (29)
  • 4
    • 85031542464 scopus 로고    scopus 로고
    • US Patent. No. 4775425 Oct. 4, 1988
    • S. Guha, S.R. Ovshinsky, US Patent. No. 4775425 Oct. 4, 1988.
    • Guha, S.1    Ovshinsky, S.R.2
  • 15
    • 25644436669 scopus 로고
    • Powder Diffraction File American Society for Testing Materials, Philadelphia
    • Powder Diffraction File, Joint Committee on Powder Diffraction Standards, American Society for Testing Materials, Philadelphia, 1967.
    • (1967) Joint Committee on Powder Diffraction Standards


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.