Direct measurement of density-of-states effective mass and scattering parameter in transparent conducting oxides using second-order transport phenomena

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 18, Issue 6, 2000, Pages 2978-2985

  Young, D L ^a   Coutts, T J ^a   Kaydanov, V I ^b   Gilmore, A S ^b   Mulligan, W P ^c  

^a NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

^b Department of Metallurgical and Materials Engineering   (United States)

^c Sunpower Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; DOPING (ADDITIVES); ELECTRIC CONDUCTIVITY OF SOLIDS; ELECTRONIC DENSITY OF STATES; FERMI LEVEL; HALL EFFECT; MAGNETRON SPUTTERING; MASS TRANSFER; RELAXATION PROCESSES; SEEBECK EFFECT; THIN FILMS; ZINC OXIDE;

BOLTZMANN TRANSPORT EQUATION; NERNST COEFFICIENTS; TRANSPARENT CONDUCTIVE OXIDE (TCO);

SEMICONDUCTING FILMS;

EID: 0034315435     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1290372     Document Type: Article

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