메뉴 건너뛰기




Volumn 71, Issue 2 I, 2000, Pages 462-466

Density-of-states effective mass and scattering parameter measurements by transport phenomena in thin films

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000326280     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1150224     Document Type: Article
Times cited : (50)

References (23)
  • 13
    • 0004077698 scopus 로고    scopus 로고
    • American Society of Testing and Materials, West Conshohocken
    • Annual Book of ASTM Standards (American Society of Testing and Materials, West Conshohocken, 1996).
    • (1996) Annual Book of ASTM Standards
  • 17
    • 4243115568 scopus 로고    scopus 로고
    • C. Y. Ho, Purdue University-Center for Information and Numerical Data Analysis and Synthesis, West Lafayette, 1989
    • C. Y. Ho, Purdue University-Center for Information and Numerical Data Analysis and Synthesis, West Lafayette, 1989.
  • 23
    • 4243124475 scopus 로고    scopus 로고
    • Ph.D. thesis, Colorado School of Mines
    • W. P. Mulligan, Ph.D. thesis, Colorado School of Mines, 1997.
    • (1997)
    • Mulligan, W.P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.