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Volumn 71, Issue 2 I, 2000, Pages 462-466
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Density-of-states effective mass and scattering parameter measurements by transport phenomena in thin films
a a b |
Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000326280
PISSN: 00346748
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1150224 Document Type: Article |
Times cited : (50)
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References (23)
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