Quantum interference in a vacuum nanotriode

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 18, Issue 6, 2000, Pages 3481-3487

  Driskill Smith, A A G ^a   Hasko, D G ^a   Ahmed, H ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC NOISE; CURRENT VOLTAGE CHARACTERISTICS; DIELECTRIC MATERIALS; ELECTRIC FIELDS; ELECTRON BEAM LITHOGRAPHY; ELECTRON ENERGY LEVELS; ELECTRON RESONANCE; ELECTRON TRANSPORT PROPERTIES; LEAKAGE CURRENTS; QUANTUM INTERFERENCE DEVICES; SEMICONDUCTOR DIODES; VACUUM;

ELECTRON TRAJECTORIES; ELECTRON WAVE FUNCTIONS; FIELD EMISSIONS; NANOELECTRONIC DEVICES; NANOPILLAR FIELD EMITTERS; VACUUM NANOTRIODES;

TRIODES;

EID: 0034315129     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1314388     Document Type: Article

References (20)

1. V. T. Binh and S. T. Purcell, Appl. Surf. Sci. 111, 157 (1997).
2. R. Ugajin, A. Ishibashi, K. Funato, and Y. Mori, Jpn. J. Appl. Phys., Part 1 73, 1 (1993).
3. A. A. G. Driskill-Smith, D. G. Hasko, and H. Ahmed, J. Vac. Sci. Technol. B 15, 2773 (1997).
4. A. A. G. Driskill-Smith, D. G. Hasko, and H. Ahmed, Appl. Phys. Lett. 71, 3159 (1997).
5. A. A. G. Driskill-Smith, D. G. Hasko, and H. Ahmed, Appl. Phys. Lett. 75, 2845 (1999).
6. A. A. G. Driskill-Smith, D. G. Hasko, and H. Ahmed, Microelectron. Eng. 53, 179 (2000).
7. W. Chen and H. Ahmed, J. Vac. Sci. Technol. B 11, 2519 (1993).
8. QuickField, Finite Element Analysis System (Tera Analysis Company, 1998).
9. C. A. Spindt, I. Brodie, L. Humphrey, and E. R. Westerberg, J. Appl. Phys. 47, 5248 (1976).
10. R. G. Forbes, J. Vac. Sci. Technol. B 17, 526 (1999).
11. H. Gould and J. Tobochnik, An Introduction to Computer Simulation Methods (Addison-Wesley, Reading, MA, 1988).
12. J. H. Coombs and J. K. Gimzewski, J. Microsc. 152, 841 (1988).
13. N. Garcia and H. Rohrer, J. Phys.: Condens. Matter 1, 3737 (1989).
14. V. T. Binh, S. T. Purcell, N. Garcia, and J. Doglioni, Phys. Rev. Lett. 69, 2527 (1992).
15. M. E. Lin, R. Reifenberger, and R. P. Andres, Phys. Rev. B 46, 15490 (1992).
16. V. T. Binh and N. Garcia, Ultramicroscopy 42, 80 (1992).
17. C. Py and R. Baptist, J. Vac. Sci. Technol. B 12, 685 (1994).
18. S. T. Purcell, V. T. Binh, and R. Baptist, J. Vac. Sci. Technol. B 15, 1666 (1997).
19. R. T. Olson, G. R. Condon, J. A. Panitz, and P. R. Schwoebel, J. Vac. Sci. Technol. B 87, 2031 (2000).
20. S. Kalbitzer and A. Knoblauch, J. Vac. Sci. Technol. B 16, 2455 (1998).