Correlation between ferroelectricity and grain structures of face-to-face annealed strontium bismuth tantalate thin films

Japanese journal of applied physics

Volumn 39, Issue 11 B, 2000, Pages

  Aizawa, Koji ^a   Ishiwara, Hiroshi ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTAL MICROSTRUCTURE; CRYSTALLIZATION; FERROELECTRICITY; GRAIN SIZE AND SHAPE; POLARIZATION; REMANENCE; SOL-GELS; STRONTIUM COMPOUNDS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

CROSS-SECTIONAL TRANSMISSION ELECTRON MICROSCOPY;

DIELECTRIC FILMS;

EID: 0034314817     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.39.l1191     Document Type: Article

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