Effect of pre-annealing on physical and electrical properties of SrBi2Ta2O9 thin films prepared by chemical solution deposition

Thin Solid Films

Volumn 354, Issue 1, 1999, Pages 111-117

  Chung, Chee Won ^a   Chung, Ilsub ^a  

^a Samsung Advanced Institute of Technology (SAIT)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

COATING TECHNIQUES; CRYSTALLIZATION; DEPOSITION; FERROELECTRIC MATERIALS; MORPHOLOGY; PEROVSKITE; POLARIZATION; RAPID THERMAL ANNEALING; SCANNING ELECTRON MICROSCOPY; STRONTIUM COMPOUNDS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

CHEMICAL SOLUTION DEPOSITION; FURNACE PRE-ANNEALING;

DIELECTRIC FILMS;

EID: 0033359635     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(99)00389-2     Document Type: Article

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