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Volumn 66, Issue 2, 2000, Pages 229-235

Towards a multiscale approach to the growth of silicon films by chemical vapor deposition

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL VAPOR DEPOSITION; EPITAXIAL GROWTH; FILM GROWTH; MASS TRANSPORTATION; MICROELECTRONICS; MORPHOLOGY; PHASE TRANSITIONS; SURFACES;

EID: 0034300788     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0254-0584(00)00323-0     Document Type: Article
Times cited : (21)

References (34)
  • 8
    • 0039135816 scopus 로고    scopus 로고
    • in: T.M. Besmann, et al. (Eds.), The Electrochemical Society, Pennington
    • K.F. Jensen, T.G. Mihopoulos, S. Rodger, H. Simka, in: T.M. Besmann, et al. (Eds.), CVD XIII, The Electrochemical Society, Pennington, 1996.
    • (1996) CVD XIII
    • Jensen, K.F.1    Mihopoulos, T.G.2    Rodger, S.3    Simka, H.4
  • 11
    • 0003494870 scopus 로고
    • in: J.L. Vossen, W. Kern (Eds.), Academic Press, San Diego, CA
    • T.F. Kuech, K.F. Jensen, in: J.L. Vossen, W. Kern (Eds.), Thin Film Processes II, Academic Press, San Diego, CA, 1991.
    • (1991) Thin Film Processes , vol.2
    • Kuech, T.F.1    Jensen, K.F.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.