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Volumn 465, Issue 3, 2000, Pages 259-265

Surface reconstructions on the (100) CoSi2 surface

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; INTERFACIAL ENERGY; MORPHOLOGY; SILICON; SURFACE ROUGHNESS; SURFACE TREATMENT;

EID: 0034291636     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(00)00683-X     Document Type: Article
Times cited : (5)

References (19)
  • 6
    • 85031547083 scopus 로고    scopus 로고
    • CASTEP 3.9 academic version, licensed under the UKCP-MSI agreement
    • CASTEP 3.9 academic version, licensed under the UKCP-MSI agreement, 1999.
    • (1999)
  • 16
    • 85031555502 scopus 로고
    • Ph.D. Thesis, Institut de Physique Expérimentale Université de Lausanne, Lausanne
    • P. Giauque, Ph.D. Thesis, Institut de Physique Expérimentale Université de Lausanne, Lausanne, 1992.
    • (1992)
    • Giauque, P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.