Scanning photoluminescence microscope with sub-micron resolution and high optical throughput at a low temperature

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 39, Issue 10, 2000, Pages 6105-6106

  Yoshimoto, Masahiro ^a  

^a KYOTO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CAMERAS; CHARGE COUPLED DEVICES; LOW TEMPERATURE PROPERTIES; OPTICAL SYSTEMS; PHOTOLUMINESCENCE; SEMICONDUCTING GALLIUM COMPOUNDS; THERMAL INSULATION; TRANSMISSION ELECTRON MICROSCOPY; VACUUM APPLICATIONS;

GALLIUM ARSENIDE PHOSPHIDE; SCANNING PHOTOLUMINESCENCE MICROSCOPE; VACUUM CHAMBER;

MICROSCOPES;

EID: 0034291267     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.39.6105     Document Type: Article

References (11)

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