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Volumn 1, Issue 2, 1998, Pages 83-85

Degradation effects at aluminum-silicon schottky diodes

Author keywords

[No Author keywords available]

Indexed keywords

AGING OF MATERIALS; ALUMINUM; DEGRADATION; ELECTRON TRANSPORT PROPERTIES; INTERFACES (MATERIALS); SEMICONDUCTING SILICON; SEMICONDUCTOR METAL BOUNDARIES; THERMAL EFFECTS;

EID: 0032142361     PISSN: 10990062     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1390644     Document Type: Article
Times cited : (3)

References (8)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.