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Volumn 1, Issue 2, 1998, Pages 83-85
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Degradation effects at aluminum-silicon schottky diodes
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Author keywords
[No Author keywords available]
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Indexed keywords
AGING OF MATERIALS;
ALUMINUM;
DEGRADATION;
ELECTRON TRANSPORT PROPERTIES;
INTERFACES (MATERIALS);
SEMICONDUCTING SILICON;
SEMICONDUCTOR METAL BOUNDARIES;
THERMAL EFFECTS;
CONDUCTIVE PASTE;
WIRE BONDING;
SCHOTTKY BARRIER DIODES;
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EID: 0032142361
PISSN: 10990062
EISSN: None
Source Type: Journal
DOI: 10.1149/1.1390644 Document Type: Article |
Times cited : (3)
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References (8)
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