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Volumn 84, Issue 3, 2000, Pages 310-314

On the thermal expansion coefficients of thin films

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; MICROACTUATORS; MICROELECTROMECHANICAL DEVICES; RESIDUAL STRESSES; SUBSTRATES; THERMAL EFFECTS; THIN FILMS; TITANIUM;

EID: 0034274617     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0924-4247(00)00311-3     Document Type: Article
Times cited : (130)

References (16)
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    • Batchelder D.N., Simmons R.O. X-ray lattice constants of crystals by a rotating camera method: Al, Ar, Au, Cu, Ge, Ne, Si. J. Appl. Phys. 36:1965;2864-2868.
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    • Batchelder, D.N.1    Simmons, R.O.2
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.