A CMOS pulse-shrinking delay element for time interval measurement

IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing

Volumn 47, Issue 9, 2000, Pages 954-958

  Chen, Poki ^a   Liu, Shen Iuan ^a   Wu, Jingshown ^a  

^a NATIONAL TAIWAN UNIVERSITY   (Taiwan)

Author keywords

Delay line; Pulse shrinking delay; TDC; Time interval measurement

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC LOSSES; ELECTRIC POTENTIAL; ELECTRIC POWER SUPPLIES TO APPARATUS; ELECTRIC POWER UTILIZATION; INTEGRATED CIRCUIT MANUFACTURE; TIME MEASUREMENT;

PULSE-SHRINKING DELAY ELEMENTS;

ELECTRIC DELAY LINES;

EID: 0034270347     PISSN: 10577130     EISSN: None     Source Type: Journal    
DOI: 10.1109/82.868466     Document Type: Article

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