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Volumn 9, Issue 3, 2000, Pages 390-398

Etching methodologies in 〈111〉-oriented silicon wafers

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; BEAMS AND GIRDERS; CRYSTAL ORIENTATION; MASKS; MICROMACHINING; PASSIVATION; REACTIVE ION ETCHING; SILICON WAFERS;

EID: 0034270086     PISSN: 10577157     EISSN: None     Source Type: Journal    
DOI: 10.1109/84.870065     Document Type: Article
Times cited : (74)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.