Atomic scale Pb chains on Si(100)

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 18, Issue 5, 2000, Pages 2371-2376

  Dong, Zhen Chao ^a   Fujita, Daisuke ^a   Yakabe, Taro ^a   Sheng, Hanyi ^a   Nejoh, Hitoshi ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; DIMERS; ENERGY GAP; IMAGE ANALYSIS; LEAD; LOW ENERGY ELECTRON DIFFRACTION; MOLECULAR DYNAMICS; MOLECULAR STRUCTURE; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR GROWTH; SUBSTRATES;

BUCKLING-FREE MODELS; CONSTANT CURRENT TOPOGRAPHIC (CCT);

SEMICONDUCTING SILICON;

EID: 0034268747     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1288198     Document Type: Article

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