Practical inverse modeling with SIESTA

IEICE Transactions on Electronics

Volumn E83-C, Issue 8, 2000, Pages 1303-1309

  Strasser, Rudolf ^a,b   Selberherr, Siegfried ^a  

^a INFINEON TECHNOLOGIES AG   (Germany)

^b INSTITUTE FOR MICROELECTRONICS   (Austria)

Author keywords

Calibration; Inverse modeling; Parallel and distributed computation; Parameter identification; Tool integration

Indexed keywords

INVERSE MODELING SYSTEM; LEVENBERG-MARQUARDT OPTIMIZER;

CALIBRATION; COMPUTER SIMULATION; ELECTRIC VARIABLES MEASUREMENT; INTEGRATION; INTERFACES (COMPUTER); INVERSE PROBLEMS; MATHEMATICAL MODELS; MOSFET DEVICES; OPTIMIZATION; PARALLEL PROCESSING SYSTEMS; PARAMETER ESTIMATION; SEMICONDUCTOR DOPING;

INTEGRATED CIRCUIT LAYOUT;

EID: 0034247962     PISSN: 09168524     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (7)

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