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Physical Review Letters

Volumn 76, Issue 9, 1996, Pages 1521-1524

In situ measurements of interface states at silicon surfaces in fluoride solutions

(3) Oskam, Gerko a Hoffmann, Peter M a Searson, Peter C a

a Johns Hopkins University (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 3743122596 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.76.1521 Document Type: Article

Times cited : (47)

References (18)

1
- 0014800514
- RCARCI
- W. Kern and D. A. Puotinen: RCA Review, 31: 187 (1970). RCARCI
- (1970) RCA Review , vol.31 , pp. 187
- Kern, W.¹ Puotinen, D.A.²

2
- 0003821752
- W. Kern, Noyes, Park Ridge
- G. S. Higashi and Y. J. Chabal, in Handbook of Semiconductor Wafer Cleaning Technology, W. Kern (Noyes, Park Ridge, 1994), p. 433.
- (1994) Handbook of Semiconductor Wafer Cleaning Technology , pp. 433
- Higashi, G.S.¹ Chabal, Y.J.²

3
- 0021427329
- SSCOA4
- H. Ubara, T. Imura, and A. Hiraki: Solid State Commun., 50: 673 (1984). SSCOA4
- (1984) Solid State Commun. , vol.50 , pp. 673
- Ubara, H.¹ Imura, T.² Hiraki, A.³

4
- 0000703152
- PRLTAO
- E. Yablonovitch, D. L. Allara, C. C. Chang, T. Gmitter, and T. B. Bright: Phys. Rev. Lett., 57: 249 (1986). PRLTAO
- (1986) Phys. Rev. Lett. , vol.57 , pp. 249
- Yablonovitch, E.¹ Allara, D.L.² Chang, C.C.³ Gmitter, T.⁴ Bright, T.B.⁵

5
- 0026918115
- SUSCAS
- P. Jakob, Y. J. Chabal, K. Raghavachari, R. S. Becker, and A. J. Becker: Surf. Sci., 275: 407 (1992). SUSCAS
- (1992) Surf. Sci. , vol.275 , pp. 407
- Jakob, P.¹ Chabal, Y.J.² Raghavachari, K.³ Becker, R.S.⁴ Becker, A.J.⁵

6
- 0000220481
- CHPLBC
- H. E. Hessel, A. Feltz, M. Reiter, U. Memmert, and R. J. Behm: Chem. Phys. Lett., 186: 275 (1991). CHPLBC
- (1991) Chem. Phys. Lett. , vol.186 , pp. 275
- Hessel, H.E.¹ Feltz, A.² Reiter, M.³ Memmert, U.⁴ Behm, R.J.⁵

7
- 21544460483
- PRLTAO
- G. S. Higashi, R. S. Becker, Y.h J. Chabal, and A. J. Becker: Phys. Rev. Lett., 58: 1656 (1991). PRLTAO
- (1991) Phys. Rev. Lett. , vol.58 , pp. 1656
- Higashi, G.S.¹ Becker, R.S.² Chabal, Y.H.³ Becker, A.J.⁴

8
- 0000417353
- PRLTAO
- R. S. Becker, G. S. Higashi, Y. J. Chabal, and A. J. Becker: Phys. Rev. Lett., 65: 1917 (1990). PRLTAO
- (1990) Phys. Rev. Lett. , vol.65 , pp. 1917
- Becker, R.S.¹ Higashi, G.S.² Chabal, Y.J.³ Becker, A.J.⁴

9
- 0001213089
- PRLTAO
- G. W. Trucks, K. Raghavachari, G. S. Higashi, and Y. J. Chabal: Phys. Rev. Lett., 65: 504 (1990). PRLTAO
- (1990) Phys. Rev. Lett. , vol.65 , pp. 504
- Trucks, G.W.¹ Raghavachari, K.² Higashi, G.S.³ Chabal, Y.J.⁴

10
- 0000852609
- APPLAB
- Y. Morita, K. Miki, and H. Tokumoto: Appl. Phys. Lett., 59: 1347 (1991). APPLAB
- (1991) Appl. Phys. Lett. , vol.59 , pp. 1347
- Morita, Y.¹ Miki, K.² Tokumoto, H.³

11
- 5644254385
- SUSCAS
- B. H. Loo, K. W. Frese, and S. R. Morrison: Surf. Sci., 109: 75 (1981). SUSCAS
- (1981) Surf. Sci. , vol.109 , pp. 75
- Loo, B.H.¹ Frese, K.W.² Morrison, S.R.³

12
- 84939383977
- BSTJAN
- E. H. Nicollean and A. Goetzberger: Bell Syst. Tech. J., 46: 1055 (1967). BSTJAN
- (1967) Bell Syst. Tech. J. , vol.46 , pp. 1055
- Nicollean, E.H.¹ Goetzberger, A.²

13
- 0028714870
- JESOAN
- G. Schlichthörl and L. M. Peter: J. Electrochem. Soc., 141: L171 (1994). JESOAN
- (1994) J. Electrochem. Soc. , vol.141 , pp. L171
- Schlichthörl, G.¹ Peter, L.M.²

14
- 67651141655
- JESOAN
- J. S. Judge: J. Electrochem. Soc., 118: 1772 (1971). JESOAN
- (1971) J. Electrochem. Soc. , vol.118 , pp. 1772
- Judge, J.S.¹

15
- 0022702904
- JPAPBE
- D. Vanmaekelbergh and F. Cardon: J. Phys. D, 19: 643 (1986). JPAPBE
- (1986) J. Phys. D , vol.19 , pp. 643
- Vanmaekelbergh, D.¹ Cardon, F.²

16
- 0023328161
- JESOAN
- D. Vanmaekelbergh, W. P. Gomes, and F. Cardon: J. Electrochem. Soc., 134: 891 (1987). JESOAN
- (1987) J. Electrochem. Soc. , vol.134 , pp. 891
- Vanmaekelbergh, D.¹ Gomes, W.P.² Cardon, F.³

17
- 85035242089
- unpublished
- G. Oskam and P. C. Searson (unpublished).
- Oskam, G.¹ Searson, P.C.²

18
- 0013574078
- JAPIAU
- D. Vanmaekelbergh, A. R. de Wit, and F. Cardon: J. Appl. Phys., 73: 5049 (1993). JAPIAU
- (1993) J. Appl. Phys. , vol.73 , pp. 5049
- Vanmaekelbergh, D.¹ De Wit, A.R.² Cardon, F.³

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