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Surface and Interface Analysis

Volumn 25, Issue 10, 1997, Pages 804-808

Chemical analysis of ternary Ti oxides using soft X-ray absorption spectroscopy

(5) Soriano, L a Abbate, M b Fernandez A c Gonzalez Elipe A R c Sanz, J M a

a INSTITUTO NICOLÁS CABRERA (Spain)

b LABORATÓRIO NACIONAL DE LUZ SÍNCROTRON (Brazil)

c INSTITUTO DE CIENCIA DE MATERIALES DE SEVILLA (Spain)

Author keywords

Electronic structure; Ti oxides; X ray absorption spectroscopy

Indexed keywords

ABSORPTION SPECTROSCOPY; CHEMICAL ANALYSIS; CHEMICAL BONDS; ELECTRONIC STRUCTURE; OXIDES; STOICHIOMETRY;

X RAY ABSORPTION SPECTROSCOPY;

X RAY SPECTROSCOPY;

EID: 0031232676 PISSN: 01422421 EISSN: None Source Type: Journal
DOI: 10.1002/(SICI)1096-9918(199709)25:10<804::AID-SIA303>3.0.CO;2-3 Document Type: Article

Times cited : (29)

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