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Volumn 68, Issue 1, 2000, Pages 140-145
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Structural characterization of Nb-TiO2 nanosized thick-films for gas sensing application
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTAL MICROSTRUCTURE;
DIFFERENTIAL THERMAL ANALYSIS;
ELECTRON MICROSCOPY;
FIRING (OF MATERIALS);
GRAIN GROWTH;
NANOSTRUCTURED MATERIALS;
NIOBIUM;
PHASE TRANSITIONS;
SCREEN PRINTING;
SEMICONDUCTOR DOPING;
THICK FILMS;
TITANIUM DIOXIDE;
DONOR DOPANT;
GAS SENSING BEHAVIOR;
CHEMICAL SENSORS;
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EID: 0034247097
PISSN: 09254005
EISSN: None
Source Type: Journal
DOI: 10.1016/S0925-4005(00)00474-3 Document Type: Article |
Times cited : (81)
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References (16)
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