Computed microtomography studies to characterize microstructure-property correlations in thermal sprayed alumina deposits

Scripta Materialia

Volumn 43, Issue 5, 2000, Pages 471-476

  Kulkarni, A ^a   Sampath, S ^a   Goland, A ^a   Herman, H ^a   Dowd, B ^b  

^a STONY BROOK UNIVERSITY   (United States)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTERIZED TOMOGRAPHY; DIELECTRIC PROPERTIES OF SOLIDS; MICROSTRUCTURE; NONDESTRUCTIVE EXAMINATION; THERMAL CONDUCTIVITY;

THERMAL SPRAYED COATINGS; X-RAY COMPUTER MICROTOMOGRAPHY;

SPRAYED COATINGS;

EID: 0034246858     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6462(00)00416-4     Document Type: Article

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