Studies on thermal property and atomic structure of the (Bi, Sb)/Si(111) surface

Applied Surface Science

Volumn 162, Issue , 2000, Pages 368-374

  Yuhara, J ^a   Matsuda, K ^a   Hattori, Y ^a   Morita, K ^a  

^a NAGOYA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; AUGER ELECTRON SPECTROSCOPY; BINARY ALLOYS; BISMUTH ALLOYS; CRYSTAL ATOMIC STRUCTURE; CRYSTAL ORIENTATION; LOW ENERGY ELECTRON DIFFRACTION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SILICON WAFERS; SURFACE STRUCTURE; THERMAL EFFECTS; THERMODYNAMIC PROPERTIES;

COAXIAL IMPACT-COLLISION ION SCATTERING SPECTROSCOPY (CAICISS);

SEMICONDUCTOR METAL BOUNDARIES;

EID: 0034246620     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(00)00217-8     Document Type: Article

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