Influence of Ag adsorbate on the Si(111)-√3 × √3-(Au, Cu) structure

Applied Surface Science

Volumn 117-118, Issue , 1997, Pages 94-98

  Yuhara, J ^a   Ishikawa, D ^a   Morita, K ^a  

^a NAGOYA UNIVERSITY   (Japan)

Author keywords

Auger electron spectroscopy; Copper; Gold; Low energy electron diffraction; Rutherford backscattering spectrometry; Silicon; Silver; Ternary metal adsorbates; Thermal annealing

Indexed keywords

ADSORPTION; ANNEALING; AUGER ELECTRON SPECTROSCOPY; COPPER; CRYSTAL ORIENTATION; GOLD; LOW ENERGY ELECTRON DIFFRACTION; METALLIC FILMS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SILVER; SURFACE PHENOMENA; SURFACE STRUCTURE;

ADSORBATES;

SEMICONDUCTING SILICON;

EID: 0031548128     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(97)80058-X     Document Type: Article

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