Structure determination of Si(111)√3 × √3-Sb surface by X-ray diffraction

Surface Science

Volumn 357-358, Issue , 1996, Pages 65-68

  Nakatani, S ^a   Kuwahara, Y ^b   Takahashi, T ^a   Aono, M ^b  

^a UNIVERSITY OF TOKYO   (Japan)

^b INST OF PHYS AND CHEMICAL RESEARCH   (Japan)

Author keywords

Antimony; Low index single crystal surfaces; Silicon; Surface structure, morphology, roughness, and topography; X ray scattering, diffraction, and reflection

Indexed keywords

ANTIMONY; COMPUTATIONAL GEOMETRY; MODEL STRUCTURES; MORPHOLOGY; REFLECTION; SILICON; SINGLE CRYSTALS; SURFACE ROUGHNESS; VACUUM APPLICATIONS; X RAY DIFFRACTION;

LAUE GEOMETRY DIFFRACTION; LOW INDEX SINGLE CRYSTAL SURFACES; TOPOGRAPHY; X RAY REFLECTION; X RAY SCATTERING;

SURFACE STRUCTURE;

EID: 0007459362     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(96)00059-3     Document Type: Article

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