Hot-electron effects in two-dimensional hopping with a large localization length

Physical Review Letters

Volumn 85, Issue 8, 2000, Pages 1718-1721

  Gershenson, M E ^a   Khavin, Yu B ^a   Reuter, D ^b   Schafmeister, P ^b   Wieck, A D ^b  

^a RUTGERS UNIVERSITY   (United States)

^b RUHR UNIVERSITY BOCHUM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON EMISSION; TEMPERATURE MEASUREMENT; THERMAL DIFFUSION;

ELECTRON OVERHEATING; HOT-ELECTRON EFFECTS; LOCALIZATION LENGTH; TWO-DIMENSIONAL HOPPING;

ELECTRON TRANSPORT PROPERTIES;

EID: 0034245979     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.85.1718     Document Type: Article

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