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Volumn 39, Issue 8 B, 2000, Pages
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Correlation between photoluminescence intensity and micro structure in amorphous silicon films prepared by reactive RF sputtering
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Author keywords
[No Author keywords available]
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Indexed keywords
AMORPHOUS SILICON;
CORRELATION METHODS;
DEFECTS;
HYDROGENATION;
MICROSTRUCTURE;
PHOTOLUMINESCENCE;
SPUTTERING;
REACTIVE SPUTTERING;
AMORPHOUS FILMS;
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EID: 0034245002
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.39.l844 Document Type: Article |
Times cited : (8)
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References (16)
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