Reactions in TiO2/Ti3Al and TiO2/TiAl bilayers: Application of target-factor analysis in Auger electron spectroscopy

Surface and Interface Analysis

Volumn 30, Issue 1, 2000, Pages 124-129

  Van Lier, J ^a   Baretzky, B ^a   Zalar, A ^b   Mittemeijer, E J ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^b Institute of Surface Engineering and Optoelectronics Ljubljana   (Slovenia)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDS; DECOMPOSITION; DIFFUSION; INTERFACES (MATERIALS); SPUTTERING; THIN FILMS; TITANIUM ALLOYS; TITANIUM DIOXIDE;

DEPTH PROFILING; ION SPUTTERING; TARGET FACTOR ANALYSIS;

CERMETS;

EID: 0034244863     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/1096-9918(200008)30:1<124::AID-SIA848>3.0.CO;2-6     Document Type: Article

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