XPS analysis with depth resolution of chemical bath-deposited ZnSe thin films

Surface and Interface Analysis

Volumn 30, Issue 1, 2000, Pages 522-526

  Chaparro, A M ^a   Maffiotte, C ^a   Herrero, J ^a   Gutierrez M T ^a  

^a CIEMAT   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; INTERFACES (MATERIALS); SUBSTRATES; X RAY PHOTOELECTRON SPECTROSCOPY; ZINC COMPOUNDS;

BUFFER LAYERS; CHEMICAL BATH DEPOSITION METHOD;

SOLAR CELLS;

EID: 0034244818     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/1096-9918(200008)30:1<522::AID-SIA746>3.0.CO;2-9     Document Type: Article

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