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Volumn 144, Issue 11, 1997, Pages 4081-4091

Chemical bath deposition of CdS thin films: An approach to the chemical mechanism through study of the film microstructure

Author keywords

[No Author keywords available]

Indexed keywords

CATALYSIS; DEPOSITION; FABRICATION; REACTION KINETICS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING CADMIUM COMPOUNDS; SEMICONDUCTING FILMS;

EID: 0031272948     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1838140     Document Type: Article
Times cited : (149)

References (24)
  • 12
    • 84866192096 scopus 로고
    • Ph.D. Thesis, Departamento de Química, Universidad Autonoma de Madrid, Madrid
    • J. M. Doña, Ph.D. Thesis, Departamento de Química, Universidad Autonoma de Madrid, Madrid (1995).
    • (1995)
    • Doña, J.M.1
  • 16
    • 84951781045 scopus 로고
    • B. O. Kobelsen, D. V. Mc Caughan, and W. Vandervorst, Editors, PV 90-11, The Electrochemical Society Proceedings Series, Pennington, NJ
    • H. E. Göbel, in Analytical Techniques for Semiconductor Material and Process Characterization, B. O. Kobelsen, D. V. Mc Caughan, and W. Vandervorst, Editors, PV 90-11, p. 238, The Electrochemical Society Proceedings Series, Pennington, NJ (1990).
    • (1990) Analytical Techniques for Semiconductor Material and Process Characterization , pp. 238
    • Göbel, H.E.1
  • 17
    • 0003466960 scopus 로고
    • Addison-Wesley Publishing Company, Inc., Reading, MA
    • G. W. Castellan, Physical Chemistry, 3rd ed., Addison-Wesley Publishing Company, Inc., Reading, MA (1983).
    • (1983) Physical Chemistry, 3rd Ed.
    • Castellan, G.W.1
  • 20
    • 5844285774 scopus 로고    scopus 로고
    • JCPDS International Center for Diffraction Data, Swarthmore, PA
    • JCPDS Data Card No. 10-454, JCPDS International Center for Diffraction Data, Swarthmore, PA.
    • JCPDS Data Card No. 10-454
  • 21
    • 5844319195 scopus 로고    scopus 로고
    • JCPDS International Center for Diffraction Data, Swarthmore, PA
    • JCPDS Data Card No. 6-0314, JCPDS International Center for Diffraction Data, Swarthmore, PA.
    • JCPDS Data Card No. 6-0314
  • 22
    • 5844273553 scopus 로고
    • H. O. Finklea, Editor, Chap. 6, Elsevier, New York
    • R. D. Rauh, in Semiconductor Electrodes, H. O. Finklea, Editor, Chap. 6, p. 278, Elsevier, New York (1988).
    • (1988) Semiconductor Electrodes , pp. 278
    • Rauh, R.D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.