Electronic structure classifications using scanning tunneling microscopy conductance imaging

Journal of Applied Physics

Volumn 84, Issue 5, 1998, Pages 2487-2496

  Horn, K M ^a   Swartzentruber, B S ^a   Osbourn, G C ^a   Bouchard, A ^a   Bartholomew, J W ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0007042219     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.368409     Document Type: Article

References (14)

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14. http://stlosf.sandia.gov/kmhorn/stm/home.html