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Volumn 45, Issue 22, 2000, Pages 3711-3724
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Electrodeposition and properties of nanostructured platinum films studied by quartz crystal impedance measurements at 10 MHz
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Author keywords
[No Author keywords available]
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Indexed keywords
DAMPING;
ELECTRIC IMPEDANCE MEASUREMENT;
ELECTRODEPOSITION;
LIQUID CRYSTALS;
NANOSTRUCTURED MATERIALS;
PLATINUM;
QUARTZ APPLICATIONS;
SURFACE ACTIVE AGENTS;
ELECTROCHEMICAL QUARTZ CRYSTAL MICROBALANCE (EQCM);
QUARTZ CRYSTAL IMPEDANCE MEASUREMENT;
METALLIC FILMS;
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EID: 0034224599
PISSN: 00134686
EISSN: None
Source Type: Journal
DOI: 10.1016/S0013-4686(00)00464-3 Document Type: Article |
Times cited : (79)
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References (49)
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