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Volumn 3, Issue , 1998, Pages 445-448

Taxonomic problems on ADC characterization

Author keywords

[No Author keywords available]

Indexed keywords

TAXONOMY; EFFECTIVE NUMBER OF BITS; INTEGRAL NONLINEARITY; MEASUREMENT METHODS;

EID: 0032269351     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article
Times cited : (2)

References (14)
  • 3
    • 0026932460 scopus 로고
    • Testing methodologies for analog-to digital converters
    • Oct
    • A. Brandolini "Testing methodologies for analog-to digital converters", IEEE Trans, on Instrumentation and Measurement, Vol. 41, pp. 595-603, Oct. 1992.
    • (1992) IEEE Trans, on Instrumentation and Measurement , vol.41 , pp. 595-603
    • Brandolini, A.1
  • 4
    • 0022882993 scopus 로고
    • Dynamic testing of a slow sample rate, high resolution data acquisition system
    • Dec
    • D. Doerfler "Dynamic testing of a slow sample rate, high resolution data acquisition system", IEEE Trans, on Instrumentation and Measurement, Vol. 35, pp. 477-482, Dec. 1986.
    • (1986) IEEE Trans, on Instrumentation and Measurement , vol.35 , pp. 477-482
    • Doerfler, D.1
  • 6
    • 0003443356 scopus 로고
    • IEEE Std. 1057-1994, The Institute of Electrical and Electronics Engineers, Inc., New York, Dec
    • IEEE Std. 1057-1994, JEEE standard for digitizing waveform records, The Institute of Electrical and Electronics Engineers, Inc., New York, Dec. 1994.
    • (1994) JEEE Standard for Digitizing Waveform Records
  • 7
    • 0003010509 scopus 로고    scopus 로고
    • Detection, digital correction and global effect of A/D converters nonlinearities
    • May
    • N. Giaquinto, M. Savino, A. Trotta, "Detection, digital correction and global effect of A/D converters nonlinearities", IMEKO TC-4 Ist International Workshop on ADC Modelling, pp. 122-127, May 1996.
    • (1996) st International Workshop on ADC Modelling , pp. 122-127
    • Giaquinto, N.1    Savino, M.2    Trotta, A.3
  • 11
    • 0028740233 scopus 로고
    • Static and dynamic testing of A/D converters using a VXI based system
    • May
    • A. Serra, P. Girão "Static and dynamic testing of A/D converters using a VXI based system", IEEE. Instrumentation and Measurement Conference, Vol. 2, pp. 903-906, May 1994.
    • (1994) IEEE. Instrumentation and Measurement Conference , vol.2 , pp. 903-906
    • Serra, A.1    Girão, P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.