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Volumn 35, Issue 8, 2000, Pages 1345-1353

Preparation and characterization of As2S3 thin films deposited using successive ionic layer adsorption and reaction (SILAR) method

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; ARSENIC COMPOUNDS; DEPOSITION; ELECTRIC CONDUCTIVITY OF SOLIDS; GLASS; LIGHT ABSORPTION; OPTICAL PROPERTIES; SILICON WAFERS; SODIUM COMPOUNDS; SYNTHESIS (CHEMICAL); THERMAL EFFECTS; THIN FILMS;

EID: 0034200034     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0025-5408(00)00330-5     Document Type: Article
Times cited : (19)

References (19)
  • 13
    • 85031563208 scopus 로고    scopus 로고
    • U.S. Patent 4,675,207, 1987
    • Y.F. Nicloau, U.S. Patent 4,675,207, 1987.
    • Nicloau, Y.F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.