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Volumn 35, Issue 8, 2000, Pages 1345-1353
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Preparation and characterization of As2S3 thin films deposited using successive ionic layer adsorption and reaction (SILAR) method
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Author keywords
[No Author keywords available]
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Indexed keywords
ADSORPTION;
ARSENIC COMPOUNDS;
DEPOSITION;
ELECTRIC CONDUCTIVITY OF SOLIDS;
GLASS;
LIGHT ABSORPTION;
OPTICAL PROPERTIES;
SILICON WAFERS;
SODIUM COMPOUNDS;
SYNTHESIS (CHEMICAL);
THERMAL EFFECTS;
THIN FILMS;
ARSENIC TRISULFIDE;
SEMICONDUCTING FILMS;
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EID: 0034200034
PISSN: 00255408
EISSN: None
Source Type: Journal
DOI: 10.1016/S0025-5408(00)00330-5 Document Type: Article |
Times cited : (19)
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References (19)
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