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Volumn 18, Issue 3, 2000, Pages 1773-1775

Internal stress of amorphous carbon nitride films

Author keywords

[No Author keywords available]

Indexed keywords

MAGNETRON SPUTTERING; NITRIDES; PERMITTIVITY; RESIDUAL STRESSES; SUBSTRATES; ULTRATHIN FILMS;

EID: 0034187085     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.591470     Document Type: Article
Times cited : (14)

References (18)
  • 10
    • 0342882104 scopus 로고    scopus 로고
    • M.A. thesis, School of Engineering, Gifu University
    • T. Iwasaki, M.A. thesis, School of Engineering, Gifu University, 1999.
    • (1999)
    • Iwasaki, T.1
  • 16
    • 0004168979 scopus 로고
    • edited by F. Yonezawa, Springer Series in Solid State Sciences, Springer, Berlin
    • H. Fritzsche, in Fundamental Physics of Amorphous Semiconductors, edited by F. Yonezawa, Springer Series in Solid State Sciences, Vol. 26 (Springer, Berlin, 1981), p. 3.
    • (1981) Fundamental Physics of Amorphous Semiconductors , vol.26 , pp. 3
    • Fritzsche, H.1
  • 18
    • 0000293935 scopus 로고
    • edited by G. Hass and R. E. Thun Academic, New York
    • R. W. Hoffman, in Physics of Thin Films, edited by G. Hass and R. E. Thun (Academic, New York, 1966), Vol. 3, p. 211.
    • (1966) Physics of Thin Films , vol.3 , pp. 211
    • Hoffman, R.W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.