Characterization and nanometer-scale modifications of Bi2Te3 surface via atomic force microscopy

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 18, Issue 3, 2000, Pages 1194-1197

  Czajka, R ^a   Horak J ^b   Lost'ak P ^c   Karamazov, S ^c   Vanis J ^d   Walachova J ^d  

^a POZNAN UNIVERSITY OF TECHNOLOGY   (Poland)

^b INSTITUTE OF INORGANIC CHEMISTRY   (Czech Republic)

^c UNIVERSITY OF PARDUBICE   (Czech Republic)

^d INSTITUTE OF PHOTONICS AND ELECTRONICS   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; LATTICE CONSTANTS; NANOSTRUCTURED MATERIALS; SURFACE STRUCTURE;

BISMUTH TELLURIDE;

SEMICONDUCTING BISMUTH COMPOUNDS;

EID: 0034186872     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.591359     Document Type: Article

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