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Volumn 348, Issue 1-2, 1996, Pages 185-191
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Transition in the growth kinetics of vacancy islands on NbSe2
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Author keywords
Atomic force microscopy; Diffusion and migration; Growth; Niobium diselenide; Scanning tunneling microscopy; Surface defects; Surface structure, morphology, roughness, and topography
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
DEFECTS;
DIFFUSION IN SOLIDS;
ETCHING;
MORPHOLOGY;
SCANNING TUNNELING MICROSCOPY;
SURFACE ROUGHNESS;
SURFACE STRUCTURE;
WATER;
BURTON-CABRERA-FRANK THEORY;
ETCH PITS;
MONOLAYER DEEP DEPRESSIONS;
NIOBIUM DISELENIDE;
SURFACE DEFECTS;
SURFACE TOPOGRAPHY;
TIP SURFACE INTERACTION;
VACANCY ISLANDS;
NIOBIUM COMPOUNDS;
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EID: 0030106836
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/0039-6028(95)00963-9 Document Type: Article |
Times cited : (7)
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References (18)
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