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Volumn 23, Issue 2, 2000, Pages 81-86

Handling of highly-moisture sensitive components - an analysis of low-humidity containment and baking schedules

Author keywords

[No Author keywords available]

Indexed keywords

DIFFUSION; MOISTURE CONTROL;

EID: 0034172093     PISSN: 1521334X     EISSN: None     Source Type: Journal    
DOI: 10.1109/6104.846930     Document Type: Article
Times cited : (8)

References (10)
  • 2
    • 33749944159 scopus 로고    scopus 로고
    • "Moisture/reflow sensitivity,"
    • vol. 3, pp. 27-35, 1998.
    • C. Grosskopt, "Moisture/reflow sensitivity," Future Circuits Int., vol. 3, pp. 27-35, 1998.
    • Future Circuits Int.
    • Grosskopt, C.1
  • 3
    • 33749884952 scopus 로고    scopus 로고
    • "Moisture sensitivity ratings for SMT packages,"
    • pp. 49-53, Sept. 1994.
    • P. Melville, "Moisture sensitivity ratings for SMT packages," Surface Mount Technol, pp. 49-53, Sept. 1994.
    • Surface Mount Technol
    • Melville, P.1
  • 7
    • 0029228960 scopus 로고    scopus 로고
    • "Diffusion model to derate moisture sensitive surface mount 1C's for factory use conditions,"
    • 1995, pp. 440-449.
    • R. Shook, T. Conrad, V. Sastry, and D. Steele, "Diffusion model to derate moisture sensitive surface mount 1C's for factory use conditions," Proc. 46th Electron. Comp. Technol. Conf., 1995, pp. 440-449.
    • Proc. 46th Electron. Comp. Technol. Conf.
    • Shook, R.1    Conrad, T.2    Sastry, V.3    Steele, D.4
  • 8
    • 0031680840 scopus 로고    scopus 로고
    • "Method for equivalent acceleration of JEDEC/IPC moisture sensitivity levels,"
    • 1998, pp. 214-219.
    • R. Shook, B. Vaccaro, and D. Gerlach, "Method for equivalent acceleration of JEDEC/IPC moisture sensitivity levels," Proc. Int. Rel. Phys. Symp., 1998, pp. 214-219.
    • Proc. Int. Rel. Phys. Symp.
    • Shook, R.1    Vaccaro, B.2    Gerlach, D.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.