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Volumn 15, Issue 3, 2000, Pages 783-792
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Variation of orientation and morphology of epitaxial SrBi2Ta2O9 and SrBi2Nb2O9 thin films via the coating-pyrolysis process
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Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
ATOMIC FORCE MICROSCOPY;
CRYSTAL ORIENTATION;
EPITAXIAL GROWTH;
FERROELECTRIC MATERIALS;
GRAIN SIZE AND SHAPE;
MORPHOLOGY;
PYROLYSIS;
SINGLE CRYSTALS;
STRONTIUM COMPOUNDS;
X RAY DIFFRACTION ANALYSIS;
EPITAXIAL THIN FILMS;
THIN FILMS;
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EID: 0034160228
PISSN: 08842914
EISSN: None
Source Type: Journal
DOI: 10.1557/JMR.2000.0112 Document Type: Article |
Times cited : (8)
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References (19)
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