Single-ion micromechanics

MRS Bulletin

Volumn 25, Issue 2, 2000, Pages 39-42

  Fischer, B E ^a   Metzger, S ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL LATTICES; CRYSTAL MICROSTRUCTURE; ELECTRON IRRADIATION; HEAVY IONS; HIGH ENERGY PHYSICS; ION BOMBARDMENT; LITHOGRAPHY; PHOTONS; SEMICONDUCTING GERMANIUM; TRANSMISSION ELECTRON MICROSCOPY; URANIUM; X RAYS;

GERMANIUM SULFIDE; SINGLE ION MICROMECHANICS;

ION BEAMS;

EID: 0034141101     PISSN: 08837694     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (6)

1. J. Vetter, R. Scholz, D. Dobrev, and L. Nistor, Nucl. Instrum. Methods B 141 (1998) p. 747.
2. B.E. Fischer, Nucl. Instrum. Methods B 30 (1988) p. 28.
3. D. Hofmann and K.O. Groeneveld, IEEE Trans. Nucl. Sci. 30 (1983) p. 931.
4. T. Kamiya, T. Suda, and R. Tanaka, Nucl. Instrum. Methods B 118 (1997) p. 423.
5. D. Dobrev, J. Vetter, N. Angert, and R. Neumann, Appl. Phys. A 69 (1999) p. 1.
6. G. Kraft, in Progress in Radio-Oncology VI, edited by H.D. Kogelnik and F. Sedlmayer (Monduzzi Editore, International Proceedings Division, Bologna, Italy, 1998) p. 673.