High energy single ion hit system combined with heavy ion microbeam apparatus

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 118, Issue 1-4, 1996, Pages 423-425

  Kamiya, T ^a   Suda, T ^a   Tanaka, R ^a  

^a JAPAN ATOMIC ENERGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

IONS; PARTICLE DETECTORS; PROBABILITY; SEMICONDUCTOR DEVICES;

HEAVY ION MICROBEAM APPARATUS; SINGLE EVENT UPSET PHENOMENA; SINGLE ION HIT SYSTEM;

ION BEAMS;

EID: 0030565166     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-583X(95)01090-4     Document Type: Article

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