Single-source MOCVD of binary alloy CoSn thin films

Journal of Materials Chemistry

Volumn 10, Issue 5, 2000, Pages 1231-1233

  Sun, Timothy H W ^a   Wang, Hui Fang ^a   Chi, Kai Ming ^a  

^a NATIONAL CHUNG CHENG UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; TIN;

ANALYTIC METHOD; ARTICLE; COMPLEX FORMATION; CRYSTAL STRUCTURE; CRYSTALLIZATION; FILM; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR; STOICHIOMETRY;

EID: 0034126831     PISSN: 09599428     EISSN: None     Source Type: Journal    
DOI: 10.1039/a909706f     Document Type: Article

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