Bombardment-induced suicide formation at rhenium-silicon interfaces studied by XPS and TEM

Fresenius' Journal of Analytical Chemistry

Volumn 365, Issue 1-3, 1999, Pages 76-82

  Reiche, R ^a   Oswald, S ^a   Hofman, D ^a   Thomas, J ^a   Wetzig, K ^a  

^a IFW DRESDEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001939144     PISSN: 09370633     EISSN: None     Source Type: Journal    
DOI: 10.1007/s002160051448     Document Type: Article

References (21)

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