Femtosecond transient reflecting grating methods and analysis of the ultrafast carrier dynamics on Si(111) surfaces

Analytical Sciences

Volumn 16, Issue 4, 2000, Pages 403-406

  Morishita, Tomohiro ^a   Hibara, Akihide ^a   Sawada, Tsuguo ^a   Tsuyumoto, Isao ^b   Harata, Akira ^c  

^a UNIVERSITY OF TOKYO   (Japan)

^b KANAZAWA INSTITUTE OF TECHNOLOGY   (Japan)

^c KYUSHU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BALLISTIC TRANSPORTS; CARRIER-CARRIER SCATTERING; FEMTOSECOND TRANSIENT; NON-EQUILIBRIUM CARRIERS; PHOTOEXCITED CARRIERS; REFLECTING GRATINGS; ULTRA-FAST DYNAMICS; ULTRAFAST CARRIER DYNAMICS;

BALLISTICS;

SILICON;

ARTICLE; DIFFUSION; DYNAMICS; GRATING; SEMICONDUCTOR; SURFACE PROPERTY;

EID: 0034101038     PISSN: 09106340     EISSN: None     Source Type: Journal    
DOI: 10.2116/analsci.16.403     Document Type: Article

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