Photoexcited carrier diffusion near a Si(111) surface and in the Si bulk

Applied Surface Science

Volumn 104-105, Issue , 1996, Pages 57-60

  Li, C M ^a   Sjodin, T ^a   Ying, Z C ^a,b   Dai, H L ^a  

^a UNIVERSITY OF PENNSYLVANIA   (United States)

^b NEW MEXICO STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; CHARGE CARRIERS; DIFFUSION IN SOLIDS; PHOTONS; RADIATION EFFECTS; SURFACE PHENOMENA;

PHOTOEXCITATION;

SEMICONDUCTING SILICON;

EID: 0030234599     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(96)00120-1     Document Type: Article

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