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Volumn 58, Issue 11, 1998, Pages 7319-7327
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Subnanosecond transient-reflecting-grating measurements and depth-profiling analysis of mesoscopic subsurface properties of a nickel single crystal
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0009585202
PISSN: 10980121
EISSN: 1550235X
Source Type: Journal
DOI: 10.1103/PhysRevB.58.7319 Document Type: Article |
Times cited : (10)
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References (26)
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