Simulation of the effect of magnification and image-rotation variations on three-dimensional reconstruction

Journal of Electron Microscopy

Volumn 49, Issue 1, 2000, Pages 179-183

  Zhang, Haibo ^a   Kashiwagi, Aiichiro ^b   Takaoka, Akio ^b  

^a XI'AN JIAOTONG UNIVERSITY   (China)

^b OSAKA UNIVERSITY   (Japan)

Author keywords

Electron microscopy; Image rotation; Magnification; Specimen tilt; Three dimensional reconstruction

Indexed keywords

ELECTRIC IMPEDANCE TOMOGRAPHY; ELECTRONS; IMAGE RECONSTRUCTION;

ELECTRON TOMOGRAPHY; HEIGHT VARIATION; IMAGE ROTATION; MAGNIFICATION; MICROSCOPIC IMAGE; OBJECTIVE LENS; SPECIMEN TILT; THREE-DIMENSIONAL RECONSTRUCTION;

ROTATION;

EID: 0034035578     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/oxfordjournals.jmicro.a023784     Document Type: Article

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