Electrical properties of gap junction hemichannels identified in transfected HeLa cells

Pflugers Archiv European Journal of Physiology

Volumn 440, Issue 3, 2000, Pages 366-379

  Valiunas, Virginijus ^a,b,c   Weingart, Robert ^a  

^a UNIVERSITY OF BERN   (Switzerland)

^b KAUNAS UNIVERSITY OF MEDICINE   (Lithuania)

^c STONY BROOK UNIVERSITY   (United States)

Author keywords

Connexin30; Connexin46; Connexin50; Electrophysiology; Gap junction; Hemichannel

Indexed keywords

GAP JUNCTION PROTEIN;

ARTICLE; CHANNEL GATING; GAP JUNCTION; GENETIC TRANSFECTION; HELA CELL; HUMAN; HUMAN CELL; ION CONDUCTANCE; ION CURRENT; PRIORITY JOURNAL;

EID: 0033936136     PISSN: 00316768     EISSN: None     Source Type: Journal    
DOI: 10.1007/s004240000294     Document Type: Article

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