Uniformity of Cd1 - xZnxTe grown by high-pressure Bridgman

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 380, Issue 1-2, 1996, Pages 132-135

  Toney, J E ^a   Brunett, B A ^a   Schlesinger, T E ^a   Van Scyoc, J M ^b   James, R B ^b   Schieber, M ^b   Goorsky, M ^c   Yoon, H ^c   Eissler, E ^d   Johnson, C ^d  

^a CARNEGIE MELLON UNIVERSITY   (United States)

^b SANDIA NATIONAL LABORATORIES   (United States)

^c UNIVERSITY OF CALIFORNIA   (United States)

^d eV Products   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION; CRYSTAL GROWTH; EMISSION SPECTROSCOPY; PERFORMANCE; PHOTOLUMINESCENCE; X RAY ANALYSIS; ZINC;

CADMIUM ZINC TELLURIDE; HIGH PRESSURE BRIDGMAN METHOD; PHOTOLUMINESCENCE MAPPING; PHOTOLUMINESCENCE SPECTROSCOPY;

SEMICONDUCTING CADMIUM COMPOUNDS;

EID: 0030264650     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(96)00373-7     Document Type: Article

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