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Volumn 380, Issue 1-2, 1996, Pages 121-126

Characterization of CdZnTe and CdTe:Cl materials and their relationship to X- and γ-ray detector performance

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CURRENT MEASUREMENT; ELECTRON TRANSPORT PROPERTIES; GAMMA RAYS; PERFORMANCE; RADIATION DETECTORS; X RAYS;

EID: 0030261877     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(96)00292-6     Document Type: Article
Times cited : (27)

References (11)
  • 1
    • 0042290544 scopus 로고
    • P. Siffert, SPIE 2305 (1995) 98.
    • (1995) SPIE , vol.2305 , pp. 98
    • Siffert, P.1
  • 6
    • 0041288816 scopus 로고    scopus 로고
    • 9th int. workshop on room temperature semiconductor X- and γ-ray detectors, associated electronics and applications
    • Grenoble, France, 1995
    • F. Lebrun, (9th Int. Workshop on Room Temperature Semiconductor X- and γ-Ray Detectors, Associated Electronics and Applications, Grenoble, France, 1995) Nucl. Instr. and Meth. A 380 (1996) 414.
    • (1996) Nucl. Instr. and Meth. A , vol.380 , pp. 414
    • Lebrun, F.1
  • 9
    • 0027150170 scopus 로고
    • C.J. Johnson et al., MRS 302 (1993) 463.
    • (1993) MRS , vol.302 , pp. 463
    • Johnson, C.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.