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Volumn 380, Issue 1-2, 1996, Pages 121-126
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Characterization of CdZnTe and CdTe:Cl materials and their relationship to X- and γ-ray detector performance
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Author keywords
[No Author keywords available]
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Indexed keywords
CURRENT VOLTAGE CHARACTERISTICS;
ELECTRIC CURRENT MEASUREMENT;
ELECTRON TRANSPORT PROPERTIES;
GAMMA RAYS;
PERFORMANCE;
RADIATION DETECTORS;
X RAYS;
CADMIUM TELLURIDE;
CADMIUM ZINC TELLURIDE;
FREE CHARGES;
NITROGEN LASERS;
THERMALLY STIMULATED CURRENT MEASUREMENT;
TIME OF FLIGHT MEASUREMENTS;
SEMICONDUCTING CADMIUM COMPOUNDS;
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EID: 0030261877
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-9002(96)00292-6 Document Type: Article |
Times cited : (27)
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References (11)
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