Uncertainties in the values obtained by surface plasmon resonance

Optical Engineering

Volumn 39, Issue 2, 2000, Pages 363-373

  Tilkens, Bernard G ^a   Lion, Yves F ^a   Renotte, Yvon L ^a  

^a UNIVERSITY OF LIÈGE   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; CHARACTERIZATION; COMPUTER SIMULATION; MATRIX ALGEBRA; METALLIC FILMS; REFLECTOMETERS; RESONANCE; SENSITIVITY ANALYSIS; THIN FILMS;

FRESNEL EQUATIONS; INDETERMINATION; SURFACE PLASMON RESONANCE; THIN DIELECTRIC LAYERS;

DIELECTRIC FILMS;

EID: 0033904792     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.602372     Document Type: Article

References (9)

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